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  • Putting the “More” in Morphology: Part 2

    Wednesday, April 10, 2013
    Technical Article
    Barbara Foster
    Part 1 of this article discussed the impact of multiplexing morphological methods, multiparametric techniques, and supervised machine-learning to answer the question "what" is there, as well as "where... read more
  • Light-Emitting Diodes: A New Solution for Fluorescence

    Saturday, October 01, 2011
    Technical Article
    Barbara Foster
    From the dramatic increase in new fluorophores to the proliferation of techniques like total internal reflection fluorescence (TIRF), photoactivated localization microscopy (PALM), and stochastic... read more
  • Laser Diffraction: A Firm Foundation for Particle Characterization

    Tuesday, August 02, 2011
    Technical Article
    Paul Kippax Carl Levoguer
    For manufacturers of solid and/or particulate products, particle size is frequently a critical parameter, and is one of the principal variables routinely used to characterize their materials. read more
  • High-Content Analysis Comes Full Circle in Only Eight Years

    Monday, April 18, 2011
    Technical Article
    Robert L. Stevenson, Ph.D.
    In eight short years, high-content analysis (HCA) has circled back to its roots, where many practitioners are again using personal instruments. read more
  • Providing Purge Gas for FTIR Systems

    Monday, April 18, 2011
    Technical Article
    Peter Froehlich Kim Myers
    While a Fourier transform infrared (FTIR) spectrophotometer provides a number of benefits relative to a scanning IR spectrophotometer,a significant disadvantage of an FTIR system is that the presence ... read more
  • Particle Image Analysis: Microscopy Takes a Technological Leap Forward

    Friday, August 29, 2008
    Technical Article
    Graham Rideal
    Electrical sensing zones, low-angle laser light scattering, field flow fractionation, photon correlation spectroscopy, hydrodynamic chromatography, and laser obscuration time are just some of the ... read more
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