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  • Putting the “More” in Morphology: Part 2

    Wednesday, April 10, 2013
    Technical Article
    Barbara Foster
    Part 1 of this article discussed the impact of multiplexing morphological methods, multiparametric techniques, and supervised machine-learning to answer the question "what" is there, as well as "where... read more
  • Light-Emitting Diodes: A New Solution for Fluorescence

    Saturday, October 01, 2011
    Technical Article
    Barbara Foster
    From the dramatic increase in new fluorophores to the proliferation of techniques like total internal reflection fluorescence (TIRF), photoactivated localization microscopy (PALM), and stochastic... read more
  • Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Thursday, June 01, 2006
    Technical Article
    David Coleman Lynn Vanatta
    Because of popular demand from readers, this installment will discuss the principles and calculations that underlie the lack-of-fit (LOF) test. read more
  • Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton Brian P. Lynch Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
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