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  • Integrating Microscopy Into the Analytical Scheme: A Pittcon® 2014 Microscopy Review

    Monday, February 24, 2014
    Technical Article
    Barbara Foster
    Microscopy is often overlooked at Pittcon®, yet of the 12,000+ scientists who attend, approximately 30% use microscopy in some form (according to ongoing research from The Microscopy & Imaging Place, ... read more

  • EAS 2012—Energizing Analytical Solutions

    Monday, August 27, 2012
    Technical Article
    Cecil Dybowski
    Since its beginnings over half a century ago, the Eastern Analytical Symposium has been “the” place to become energized about the latest developments in analytical technology and methodology. read more

  • High-Content Analysis Comes Full Circle in Only Eight Years

    Monday, April 18, 2011
    Technical Article
    Robert L. Stevenson, Ph.D.
    In eight short years, high-content analysis (HCA) has circled back to its roots, where many practitioners are again using personal instruments. read more

  • Providing Purge Gas for FTIR Systems

    Monday, April 18, 2011
    Technical Article
    Peter Froehlich Kim Myers
    While a Fourier transform infrared (FTIR) spectrophotometer provides a number of benefits relative to a scanning IR spectrophotometer,a significant disadvantage of an FTIR system is that the presence ... read more

  • Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton Brian P. Lynch Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
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