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  • A High-Precision Calibration Method for Spectrometers

    Friday, April 08, 2011
    Application Note
    Edith Perret Tobias E. Balmer
    Spectrometer calibration accuracy is of critical importance for many optical characterization techniques such as Raman spectroscopy and interferometry. read more
  • Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Thursday, June 01, 2006
    Technical Article
    David Coleman Lynn Vanatta
    Because of popular demand from readers, this installment will discuss the principles and calculations that underlie the lack-of-fit (LOF) test. read more
  • Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton Brian P. Lynch Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
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