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Thorough Risk Assessment Supports At-Scale Process Safety
Wednesday, July 16, 2014
Application Note
Urs Groth
It goes without saying that in any manufacturing environment no one sets out to design an unsafe process. However, it is not enough to ensure a process will be safe under normal operating conditions. read more
Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two
Thursday, March 07, 2013
Technical Article
Barbara Foster
The year 2013 celebrates a new benchmark for imaging at Pittcon^®. Historically, Pittcon has not been considered an imaging meeting, despite the fact that a review of Pittcon 2012 statistics revealed ... read more
A System Approach to Automated Scanning Electron Microscopy
Tuesday, August 02, 2011
Technical Article
Timothy J. Drake Frederick H. Schamber
Much of the innovative activity in scanning electron microscopes (SEMs)has been devoted to ultrahigh-magnification instruments for the use of researchers characterizing materials and processes at ... read more
General Laboratory Equipment: Innovation Showcase
Monday, May 09, 2011
Technical Article
Jeanely Hunt, MS, MBA
Each year, manufacturers and distributors flesh out many innovations for the laboratory, ranging from simple accessories to large, more complex instrumentation. read more
A Multifrequency Temperature-Modulated Technique For DSC
Sunday, January 01, 2006
Application Note
Markus Schubnell Christoph Heitz Thomas Hütter Steven Sauerbrunn Juergen E.K. Schawe
In conventional differential scanning calorimetry (DSC), a sample is subjected to a temperature program with a constant heating rate. As a result, the DSC instrument delivers an output signal, which, ... read more
A High-Sensitivity Sensor for DSC
Friday, August 05, 2005
Application Note
Rudolf Riesen Blaine Weddle
A dramatic increase in sensitivity at low signal noise without a significant loss in signal resolution has been achieved with the HSS7 high-sensitivity sensor. read more