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  • Thorough Risk Assessment Supports At-Scale Process Safety

    Thorough Risk Assessment Supports At-Scale Process Safety

    Wednesday, June 11, 2014
    Application Note
    Urs Groth
    It goes without saying that in any manufacturing environment no one sets out to design an unsafe process. However, it is not enough to ensure a process will be safe under normal operating conditions. read more
  • Integrating Microscopy Into the Analytical Scheme: A Pittcon® 2014 Microscopy Review

    Integrating Microscopy Into the Analytical Scheme: A Pittcon® 2014 Microscopy Review

    Monday, February 24, 2014
    Technical Article
    Barbara Foster
    Microscopy is often overlooked at Pittcon®, yet of the 12,000+ scientists who attend, approximately 30% use microscopy in some form (according to ongoing research from The Microscopy & Imaging Place, ... read more
  • EAS 2012—Energizing Analytical Solutions

    EAS 2012—Energizing Analytical Solutions

    Monday, August 27, 2012
    Technical Article
    Cecil Dybowski
    Since its beginnings over half a century ago, the Eastern Analytical Symposium has been “the” place to become energized about the latest developments in analytical technology and methodology. read more
  • A Multifrequency Temperature-Modulated Technique For DSC

    A Multifrequency Temperature-Modulated Technique For DSC

    Sunday, January 01, 2006
    Application Note
    Markus Schubnell, Christoph Heitz, Thomas Hütter, Steven Sauerbrunn, Juergen E.K. Schawe
    In conventional differential scanning calorimetry (DSC), a sample is subjected to a temperature program with a constant heating rate. As a result, the DSC instrument delivers an output signal, which, ... read more
  • A High-Sensitivity Sensor for DSC

    A High-Sensitivity Sensor for DSC

    Friday, August 05, 2005
    Application Note
    Rudolf Riesen, Blaine Weddle
    A dramatic increase in sensitivity at low signal noise without a significant loss in signal resolution has been achieved with the HSS7 high-sensitivity sensor. read more
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