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  • Putting the “More” in Morphology: Part 2

    Wednesday, April 10, 2013
    Technical Article
    Barbara Foster
    Part 1 of this article discussed the impact of multiplexing morphological methods, multiparametric techniques, and supervised machine-learning to answer the question "what" is there, as well as "where... read more

  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more

  • Light-Emitting Diodes: A New Solution for Fluorescence

    Saturday, October 01, 2011
    Technical Article
    Barbara Foster
    From the dramatic increase in new fluorophores to the proliferation of techniques like total internal reflection fluorescence (TIRF), photoactivated localization microscopy (PALM), and stochastic... read more
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