Craig S. Schwandt

Particle Characterization: Challenges Associated With Submicrometer-Sized Objects
Wednesday, April 02, 2014
Materials in the form of particulate or engineered objects are relatively easy to characterize in terms of their composition, shape, size, and size distribution, provided they are larger than 1 µm in... read more
Characterizing Nanometer-Scale Materials Using a Low-Angle Backscattered Electron Detector
Monday, November 01, 2010
Understanding the properties of new materials prior to fabrication can be challenging. Often, the structure of a material at very small scales is critical to its properties and performance. read more

Articles by Craig S. Schwandt