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  • Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two

    Thursday, March 07, 2013
    Technical Article
    Barbara Foster
    The year 2013 celebrates a new benchmark for imaging at Pittcon®. Historically, Pittcon has not been considered an imaging meeting, despite the fact that a review of Pittcon 2012 statistics revealed ... read more

  • A System Approach to Automated Scanning Electron Microscopy

    Tuesday, August 02, 2011
    Technical Article
    Timothy J. Drake Frederick H. Schamber
    Much of the innovative activity in scanning electron microscopes (SEMs)has been devoted to ultrahigh-magnification instruments for the use of researchers characterizing materials and processes at ... read more

  • General Laboratory Equipment: Innovation Showcase

    Monday, May 09, 2011
    Technical Article
    Jeanely Hunt, MS, MBA
    Each year, manufacturers and distributors flesh out many innovations for the laboratory, ranging from simple accessories to large, more complex instrumentation. read more

  • Fast, Practical GC and GC-MS

    Monday, January 01, 2007
    Technical Article
    Jaap de Zeeuw Martine Barnes
    Shortening run times is a welcome exercise for many laboratories, especially when sample throughput needs to be increased. read more
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