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  • Micro Raman at Pittcon® 2012

    Monday, May 07, 2012
    Technical Article
    Barbara Foster
    Micro Raman was big news at Pittcon® 2012. While the hardware has stabilized, there were intriguing new developments in the science and its applications. read more

  • Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Thursday, June 01, 2006
    Technical Article
    David Coleman Lynn Vanatta
    Because of popular demand from readers, this installment will discuss the principles and calculations that underlie the lack-of-fit (LOF) test. read more

  • Sizing Particles

    Tuesday, November 01, 2005
    Technical Article
    Michael Levin
    Many methods and numerous instruments are available from recognized vendors to measure particle size. read more
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