The advent of new technologies and materials with specific properties designed and manifested at the sub-micron scale has ushered in an increased need to equip characterization labs with innovative -- yet compact -- scanning electron microscopy (SEM) and microanalysis (EDS or XRF) setups. The purpose of such a resource is to provide, in most cases, an easy-to-use platform that will serve as an initial step in materials characterization workflow. This SEM/EDS resource will perform full characterization of a specimen, requiring a high level of performance in terms of resolution, complimentary analytical detectors, and software for comprehensive analysis.
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