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  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more

  • R&D Informatics at Molecular Med Tri-Con 2013

    Tuesday, February 26, 2013
    Technical Article
    Robert L. Stevenson, Ph.D.
    Integrated R&D Informatics and Knowledge Management (I&KM) was the title of one of the 15 programs spread over three days at the 20th Molecular Med Tri-Con held February 13–15 at the Moscone Center in... read more

  • High-Throughput Tools for Optimizing Drug Nanosuspensions

    Thursday, February 19, 2015
    Application Note
    Dennis H. Leung Timothy Rhodes Annette Bak
    Inadequate absorption and bioavailability often make it difficult to deliver the drug to the target in vivo and pose significant challenges to the discovery and development of new drugs. A number of ... read more
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