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  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more
  • New Electronic Pipetting Technology

    Thursday, March 07, 2013
    Technical Article
    Robert McNeil
    Pipetting of samples and reagents is essential for reliable results. To meet this goal, pipetting has to be done with the highest precision and accuracy, but it must be done safely, without causing ... read more
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