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  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more

  • Statistics in Analytical Chemistry: Part 25—Calibration Summary

    Thursday, February 01, 2007
    Technical Article
    David Coleman Lynn Vanatta
    In a modern chemical-analysis laboratory, virtually all of the testing equipment must be calibrated periodically. read more

  • Centrifuge Safety and Security

    Thursday, February 01, 2007
    Application Note
    Tammy Goodman
    For laboratories around the world, increasing health and safety legislation requires that equipment be operated and maintained so that every step is taken to maximize safety and security. read more

  • Reagent-Free Ion Chromatography Systems With Eluent Regeneration: RFIC-ER Systems

    Thursday, February 01, 2007
    Application Note
    Yan Liu Zhongqing Lu Chris Pohl John Madden Navette Shirakawa
    Since the introduction of ion chromatography (IC) in 1975, Dionex Corp. (Sunnyvale, CA) has continued to improve the performance of IC systems while developing new capabilities for the determination ... read more

  • The Nanoliter Syringes

    Thursday, February 01, 2007
    Technical Article
    Andrew D. Sauter
    Following an informal collaboration with Affymax (Palo Alto, CA), Agilent Technologies (Palo Alto, CA), and Chem-Space Associates (Pittsburgh, PA), studying electrospray ionization 1 (ESI), the ... read more
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