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  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West Zhiqiang Peng Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more

  • New Instrumentation and Applications at HPLC 2012

    Friday, August 10, 2012
    Technical Article
    Robert L. Stevenson, Ph.D.
    A marketplace is usually dynamic, with a cross-current of disparate interests meeting to find mutual satisfaction. read more

  • Sample Prep for LC, GC, and SFC at Pittcon® 2013

    Friday, May 10, 2013
    Technical Article
    Robert L. Stevenson, Ph.D.
    At Pittcon® 2013, sample prep stood out as a major focus, perhaps because of the few advances in chromatography instrumentation. In addition, some sample preparation is spilling over into other ... read more

  • Sample Processing at Pittcon® 2014

    Tuesday, May 06, 2014
    Application Note
    Robert L. Stevenson, Ph.D.
    The tenfold increase in speed for the analytics (GC, HPLC, and SFC [supercritical fluid chromatography], all with MS) over the last decade has shifted the choke point in many workflows from analytics ... read more
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