Company Overview

EDAX

Contact Info
Phone: 800 535 3329
Email: [email protected]
Website: www.edax.com/

EDAX is a leading provider of innovative materials characterization systems encompassing:

• Energy Dispersive Spectrometry (EDS)
• Wavelength Dispersive Spectrometry (WDS)
• Electron Backscatter Diffraction (EBSD)
• X-ray Fluorescence (XRF) analyzers

The integration of EDS, EBSD and WDS detectors with the electron microscope allows users to determine both the elemental and microstructural characteristics of different materials. Collaboration between the microscope manufacturers and EDAX provides seamless designs that enable the detectors, electronics and software to operate in an uncompromised environment.

EDAX provides a comprehensive range of tools to meet the most demanding needs of today’s scientists. The company’s portfolio includes:

• Standalone and integrated tools for EDS, EBSD and WDS
• Bench-top micro-XRF (µXRF) analyzers, providing a platform for small and micro-spot x-ray analysis and mapping - easy to operate and engineered to accommodate various sample types and shapes from different sources
• X-ray metrology tools for coating thickness and and composition measurements (analysis) of multi-layered materials for in-line and off-line process control applications.

EDAX is committed to developing the best systems for micro- and nano-characterization, where elemental and/or structural information is required.

EDAX designs, manufactures, distributes and services products for a broad range of industries, educational institutions and research organizations.

Market segments include: criminal and industrial forensics, security, semiconductor and microelectronics, academic and industrial R&D laboratories, ROHS/WEEE, renewable energy, pharmaceuticals, mining, catalysts, petrochemicals, ceramics, metallurgy and manufacturing operations.

For more information about EDAX, please visit our web site at www.edax.com

 Pittcon Offerings

Register at the EDAX booth #2057 for a demonstration at the Hitachi booth #1957 of:

• The Octane Plus Silicon Drift Detector (SDD) for high quality EDS analysis performed at high count rates.
• The Octane Elite (SDD) – a brand new detector with a Silicon Nitride window, which offers an increase in light element sensitivity of up to 35% with the highest throughput available.

Come to the EDAX space on the AMETEK booth #2057 for more information about:

• The XLNCE SMX-BEN benchtop analyzer for coating thickness and composition analysis.
• The Orbis Micro-XRF analyzer for non-destructive air or vacuum analysis for inorganic elements.

For more information please email us at [email protected] or visit www.edax.com