JEOL celebrates the 10th anniversary of the introduction of the AccuTOF^TM-DART® ambient ionization mass spectrometer by introducing the new AccuTOF^TM-DART®4G. New performance capabilities include enhanced resolution, speed, and accuracy in a rugged, flexible, versatile design.

The AccuTOF-DART 4G couples the easy operation of the DART ion source with the high-resolution, accurate mass capability of the AccuTOF time-of-flight mass spectrometer. Not only can the user rapidly acquire data for mixtures and complete unknowns without sample carryover, but the resulting spectra yield unambiguous assignments, isotopic ratios and elemental compositions.

 The DART® ion source won the Pittcon 2005 Editors' Gold Award for Best New Product when it was introduced by JEOL that year. Co-inventor Dr. Robert (Chip) Cody of JEOL recently co-authored a textbook with Marek Domin of the Merket Chemistry Center, Boston College, examining the growth of ambient ionization and the impact of this revolutionary mass spectrometry technique. The new book, Ambient Ionization Mass Spectrometry, is now available from the Royal Society of Chemistry.

The newly-introduced 4th generation AccuTOF GCx is the only high-resolution mass spectrometer that combines GCxGC with a choice of EI, CI, & FI ion sources. The unique JEOL combination EI/FI/FD source offers a powerful and routine alternative to chemical ionization for a wide range of applications.

Additionally JEOL offers the unique ultrahigh resolution MALDI-TOF system, SpiralTOF^TM with MALDI imaging and TOF-TOF options.

 Visit JEOL in booth #65 at ASMS in St. Louis to see how there's more than one way to answer your mass spec questions! www.jeolusa.com/ms or contact [email protected].