The image on the cover of American Laboratory August is an ion beam polished cross-section of shale showing silicate minerals, pyrite “framboise” and keragen. The sample was prepared on an argon beam cross-section polisher and captured with a JEOL Field Emission SEM with low angle backscatter. Original magnification 2000×. Image courtesy of JEOL USA, Inc. (Peabody, MA, U.S.A.).Field emission scanning electron microscopy is a useful technique for observing materials such as shales and mudstones at the nanometer scale.
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