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  • Hyphenation: The Next Step in Thermal Analysis

    Hyphenation: The Next Step in Thermal Analysis

    Friday, January 01, 2010
    Technical Article
    Kevin P. Menard, Richard Spragg, Greg Johnson, Craig Sellman
    Thermal analysis, like most mature technologies, sees mostly incremental increases in its capabilities, such as the introduction of modulated temperature techniques in the early 1990s or the ... read more
  • Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Thursday, June 01, 2006
    Technical Article
    David Coleman, Lynn Vanatta
    Because of popular demand from readers, this installment will discuss the principles and calculations that underlie the lack-of-fit (LOF) test. read more
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