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  • Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Statistics in Analytical Chemistry: Part 22—Lack-of-Fit Details

    Thursday, June 01, 2006
    Technical Article
    David Coleman, Lynn Vanatta
    Because of popular demand from readers, this installment will discuss the principles and calculations that underlie the lack-of-fit (LOF) test. read more
  • Dielectrophoretic Force Microscopy

    Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton, Brian P. Lynch, Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
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