Article Archives

Filter

Hide Filter
  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West, Zhiqiang Peng, Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more
  • Use of New Scanning Technology to Elucidate Ion Channel Mobility

    Use of New Scanning Technology to Elucidate Ion Channel Mobility

    Friday, April 01, 2005
    Application Note
    Angela Goodacre, Kristen M.S. O’Connell, Michael M. Tamkun
    Fluorescent chromophores fused to specific proteins have greatly increased our ability to image dynamic events within the living cell. read more
  • Dielectrophoretic Force Microscopy

    Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton, Brian P. Lynch, Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
  • <<
  • >>