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  • Optimizing HPLC Sample Preparation

    Optimizing HPLC Sample Preparation

    Monday, February 06, 2012
    Technical Article
    Caitlin Smith
    Sample preparation is an important component for analysis in high-performance liquid chromatography (HPLC)/ultra high-performance liquid chromatography (UHPLC). This article outlines commonly used ... read more
  • A New Approach to Atomic Force Microscopy for Nanometrology Applications

    A New Approach to Atomic Force Microscopy for Nanometrology Applications

    Friday, April 01, 2005
    Application Note
    Paul West, Zhiqiang Peng, Natalia Starostina
    Since the invention of the atomic force microscope (AFM), the use of high-resolution topographic images has become the standard in microscopy and surface science publications. read more
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