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  • Thorough Risk Assessment Supports At-Scale Process Safety

    Thorough Risk Assessment Supports At-Scale Process Safety

    Wednesday, June 11, 2014
    Application Note
    Urs Groth
    It goes without saying that in any manufacturing environment no one sets out to design an unsafe process. However, it is not enough to ensure a process will be safe under normal operating conditions. read more
  • Pittcon® 2012 Roundup of Spectroscopy and Mass Spectrometry

    Pittcon® 2012 Roundup of Spectroscopy and Mass Spectrometry

    Monday, May 07, 2012
    Technical Article
    Jeffrey M. Perkel
    This past March, some 15,754 people from 90 countries descended on Orlando, Florida, for the annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon®). read more
  • A Multifrequency Temperature-Modulated Technique For DSC

    A Multifrequency Temperature-Modulated Technique For DSC

    Sunday, January 01, 2006
    Application Note
    Markus Schubnell, Christoph Heitz, Thomas Hütter, Steven Sauerbrunn, Juergen E.K. Schawe
    In conventional differential scanning calorimetry (DSC), a sample is subjected to a temperature program with a constant heating rate. As a result, the DSC instrument delivers an output signal, which, ... read more
  • A High-Sensitivity Sensor for DSC

    A High-Sensitivity Sensor for DSC

    Friday, August 05, 2005
    Application Note
    Rudolf Riesen, Blaine Weddle
    A dramatic increase in sensitivity at low signal noise without a significant loss in signal resolution has been achieved with the HSS7 high-sensitivity sensor. read more
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