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  • Thorough Risk Assessment Supports At-Scale Process Safety

    Thorough Risk Assessment Supports At-Scale Process Safety

    Wednesday, July 16, 2014
    Application Note
    Urs Groth
    It goes without saying that in any manufacturing environment no one sets out to design an unsafe process. However, it is not enough to ensure a process will be safe under normal operating conditions. read more
  • Sample Processing at Pittcon® 2014

    Sample Processing at Pittcon® 2014

    Tuesday, May 06, 2014
    Application Note
    Robert L. Stevenson, Ph.D.
    The tenfold increase in speed for the analytics (GC, HPLC, and SFC [supercritical fluid chromatography], all with MS) over the last decade has shifted the choke point in many workflows from analytics ... read more
  • Separation Science Highlights From Pittcon® 2011

    Separation Science Highlights From Pittcon® 2011

    Tuesday, May 10, 2011
    Technical Article
    Robert L. Stevenson, Ph.D.
    At Pittcon® 2011, most new products appeared to be evolutionary, not revolutionary. read more
  • A Multifrequency Temperature-Modulated Technique For DSC

    A Multifrequency Temperature-Modulated Technique For DSC

    Sunday, January 01, 2006
    Application Note
    Markus Schubnell, Christoph Heitz, Thomas Hütter, Steven Sauerbrunn, Juergen E.K. Schawe
    In conventional differential scanning calorimetry (DSC), a sample is subjected to a temperature program with a constant heating rate. As a result, the DSC instrument delivers an output signal, which, ... read more
  • A High-Sensitivity Sensor for DSC

    A High-Sensitivity Sensor for DSC

    Friday, August 05, 2005
    Application Note
    Rudolf Riesen, Blaine Weddle
    A dramatic increase in sensitivity at low signal noise without a significant loss in signal resolution has been achieved with the HSS7 high-sensitivity sensor. read more
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