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  • A High-Precision Calibration Method for Spectrometers

    A High-Precision Calibration Method for Spectrometers

    Friday, April 08, 2011
    Application Note
    Edith Perret, Tobias E. Balmer
    Spectrometer calibration accuracy is of critical importance for many optical characterization techniques such as Raman spectroscopy and interferometry. read more
  • Dielectrophoretic Force Microscopy

    Dielectrophoretic Force Microscopy

    Wednesday, January 19, 2005
    Application Note
    Al M. Hilton, Brian P. Lynch, Garth J. Simpson
    Dielectrophoresis (DEP), the force exerted on a polarizable particle in a nonuniform electric field, has been used with great success in recent years to manipulate and separate cells and biomolecules. read more
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