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  • Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two

    Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two

    Thursday, March 07, 2013
    Technical Article
    Barbara Foster
    The year 2013 celebrates a new benchmark for imaging at Pittcon®. Historically, Pittcon has not been considered an imaging meeting, despite the fact that a review of Pittcon 2012 statistics revealed ... read more
  • A System Approach to Automated Scanning Electron Microscopy

    A System Approach to Automated Scanning Electron Microscopy

    Tuesday, August 02, 2011
    Technical Article
    Timothy J. Drake, Frederick H. Schamber
    Much of the innovative activity in scanning electron microscopes (SEMs)has been devoted to ultrahigh-magnification instruments for the use of researchers characterizing materials and processes at ... read more
  • General Laboratory Equipment: Innovation Showcase

    General Laboratory Equipment: Innovation Showcase

    Monday, May 09, 2011
    Technical Article
    Jeanely Hunt, MS, MBA
    Each year, manufacturers and distributors flesh out many innovations for the laboratory, ranging from simple accessories to large, more complex instrumentation. read more
  • Increased Throughput in Method 8270 Analysis

    Increased Throughput in Method 8270 Analysis

    Monday, January 01, 2007
    Application Note
    William D. Goodman, Frank DeLorenzo
    Method 8270 is a GC-MS method created by the U.S. EPA Office of Solid Waste for the analysis of semivolatile organics by gas chromatography-mass spectrometry. read more
  • Automated Chemical Ionization in GC-MS

    Automated Chemical Ionization in GC-MS

    Monday, January 01, 2007
    Application Note
    Chris Sandy, Jean-Francois Garnier, Bernhard Rothweiler, Fred Feyerherm, Sihem Ben Mahmoud, Harry F. Prest
    Gas chromatography with mass spectrometric detection using chemical ionization (CI) has demonstrated great utility in a wide variety of application areas ranging from forensics to environmental to ... read more
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