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  • Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two

    Thursday, March 07, 2013
    Technical Article
    Barbara Foster
    The year 2013 celebrates a new benchmark for imaging at Pittcon®. Historically, Pittcon has not been considered an imaging meeting, despite the fact that a review of Pittcon 2012 statistics revealed ... read more

  • A System Approach to Automated Scanning Electron Microscopy

    Tuesday, August 02, 2011
    Technical Article
    Timothy J. Drake Frederick H. Schamber
    Much of the innovative activity in scanning electron microscopes (SEMs)has been devoted to ultrahigh-magnification instruments for the use of researchers characterizing materials and processes at ... read more

  • General Laboratory Equipment: Innovation Showcase

    Monday, May 09, 2011
    Technical Article
    Jeanely Hunt, MS, MBA
    Each year, manufacturers and distributors flesh out many innovations for the laboratory, ranging from simple accessories to large, more complex instrumentation. read more

  • Hyphenation: The Next Step in Thermal Analysis

    Friday, January 01, 2010
    Technical Article
    Kevin P. Menard Richard Spragg Greg Johnson Craig Sellman
    Thermal analysis, like most mature technologies, sees mostly incremental increases in its capabilities, such as the introduction of modulated temperature techniques in the early 1990s or the ... read more
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