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  • Laser Diffraction: A Firm Foundation for Particle Characterization

    Laser Diffraction: A Firm Foundation for Particle Characterization

    Tuesday, August 02, 2011
    Technical Article
    Paul Kippax, Carl Levoguer
    For manufacturers of solid and/or particulate products, particle size is frequently a critical parameter, and is one of the principal variables routinely used to characterize their materials. read more
  • High-Content Analysis Comes Full Circle in Only Eight Years

    High-Content Analysis Comes Full Circle in Only Eight Years

    Monday, April 18, 2011
    Technical Article
    Robert L. Stevenson, Ph.D.
    In eight short years, high-content analysis (HCA) has circled back to its roots, where many practitioners are again using personal instruments. read more
  • Providing Purge Gas for FTIR Systems

    Providing Purge Gas for FTIR Systems

    Monday, April 18, 2011
    Technical Article
    Peter Froehlich, Kim Myers
    While a Fourier transform infrared (FTIR) spectrophotometer provides a number of benefits relative to a scanning IR spectrophotometer,a significant disadvantage of an FTIR system is that the presence ... read more
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