Imaging of Graphene with Confocal Raman and Atomic Force Microscopy (AFM)

Graphene is a two-dimensional material and as such is applicable in a wide variety of fields. Graphene characterization requires the use of a measurement tool that is nondestructive. An effective tool is confocal Raman-atomic force microscopy (AFM): Raman imaging provides insight into a material’s molecular composition, while AFM is able to give information on the physical aspects of a nano-material. This article demonstrates two examples in which the nondestructive characterization of graphene is carried out using the the alpha300 RA confocal Raman-AFM microscope system.

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