For the study of molecular structure, X-ray diffraction is a very powerful method that enables scientists to analyze the specific angles of diffracted X-rays and their intensities. X-ray diffraction has been used in a host of applications, such as in the analysis of thin films, and studying sample stress and strain and crystal structure. New developments in X-ray diffraction include dual-wavelength systems, which offer higher-intensity X-rays, therefore utilizing less pure crystal sample and improving throughput.
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