Barbara Foster

Ms. Foster is President and Chief Strategic Officer, The Microscopy & Imaging Place, Inc., McKinney, TX, and Consulting Editor, American Laboratory/Labcompare; e-mail: bfoster@the-mip.com.

Putting the “More” in Morphology: Part 2
Wednesday, April 10, 2013
Part 1 of this article discussed the impact of multiplexing morphological methods, multiparametric techniques, and supervised machine-learning to answer the question "what" is there, as well as "where... read more
Putting the “More” in Morphology: Part 1
Wednesday, April 10, 2013
Segmentation, the ability to define the unique features in a region of interest, has always been the greatest challenge in image analysis and quantitation. A new suite of tools, available from ... read more
Microscopy + Spectroscopy: Pittcon® 2013 Celebrates the Power of Two
Thursday, March 07, 2013
The year 2013 celebrates a new benchmark for imaging at Pittcon^®. Historically, Pittcon has not been considered an imaging meeting, despite the fact that a review of Pittcon 2012 statistics revealed ... read more
Micro Raman at Pittcon^® 2012
Monday, May 07, 2012
Micro Raman was big news at Pittcon® 2012. While the hardware has stabilized, there were intriguing new developments in the science and its applications. read more
Microscopy: Imaging Broader, Diving Deeper
Monday, April 09, 2012
In previous articles and editorials, the life sciences have been defined as the “next big growth area” in microscopy, spectroscopy, and related imaging techniques. read more
New Atomic Force Microscopy (AFM) Approaches Life Sciences Gently, Quantitatively, and Correlatively
Monday, April 09, 2012
As discussed in last November’s Editor’s Page, the life sciences are the key sector propelling growth in microscopy and imaging. read more
The State of Microscopy for 2012
Tuesday, November 01, 2011
In various recent interviews, I’ve been asked about the state of microscopy and, most specifically, the rise of technologies such as AFM (atomic force microscopy) and Raman confocal and the ... read more
Light-Emitting Diodes: A New Solution for Fluorescence
Saturday, October 01, 2011
From the dramatic increase in new fluorophores to the proliferation of techniques like total internal reflection fluorescence (TIRF), photoactivated localization microscopy (PALM), and stochastic... read more
New Solutions for Surface Texture Analysis
Monday, November 01, 2010
Most microscopists are familiar with confocal microscopy from neuroscience or cell biology. However, very quietly and abruptly, confocal has jumped the fence into industry, becoming a major tool-of-... read more
Focus on Microscopy: One Button and Two Heads—Mainstreaming AFM
Friday, April 17, 2009
The past decade has seen dramatic growth in scanning probe microscopy (SPM) technology, both in functionality and in broader acceptance. Market research conducted in mid-2007 by The Microscopy and ... read more
AFM/Raman Opens New Horizons for Research and Industrial Characterization
Thursday, March 01, 2007
Atomic force microscopy (AFM)/Raman is the latest trend in hybrid imaging/chemical analysis instrumentation. read more
Focus on Microscopy: Spectroscopy + Microscopy + . . .? What’s Next?
Tuesday, November 01, 2005
Thomas Friedman, author of the recent book, The World is Flat, identified convergence of technologies as a key driving force shaping today’s world. read more
Focus on Microscopy: AFM’s New Nanotomography Expands 3-D Imaging
Sunday, May 01, 2005
Atomic force microscopy (AFM) is well known for its ability to image and measure surface properties. read more