7500 Atomic Force Microscope (AFM) from Agilent Technologies

The 7500 Atomic Force Microscope (AFM) from Agilent Technologies is the next generation platform for nanoscale measurement, characterization and manipulation in materials science, polymer science, electrochemistry, electrical characterization and life science. Features include a closed loop 90 μm scanner, exceptionally flat scan and a standard nose cone that supports an expanded set of imaging modes. The sealed, small volume chamber ensures high precision environmental and temperature control.