Materials Characterization Systems

Celebrating the company’s 50th anniversary, EDAX gives an overview of the exciting new technology and  latest developments in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD) and Micro-XRF tools released in 2012.  The overview includes the TEAM Pegasus Analysis System for materials characterization studies for elemental analysis and crystal structure measurements; the Hikari XP EBSD Camera for hi-speed data collection that features 650 index points/sec and 100pA sensitivity; New Octane Series Silicon Drift Detectors for increased resolution that can be used for a variety of applications, such as biologics, geology, metals, semiconductors, and more; and the Orbis Micro-XRF Spectrometer for elemental analysis and imaging of samples in criminal forensics, non-destructive testing, materials, and more.