Nov/Dec 2009
Volume 41, Number 12
The expanding role of cryo-SEM in materials sciences is discussed in the November/December issue. A fluorescence and brightfield microscope for challenging documentation issues is described in another article, while another demonstrates the benefits of a helium ion microscope for imaging soft materials.
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Table of Contents
Jens Greiser
Sunday, November 01, 2009
Science is driving the demand for nanoscale resolution. Cryo-scanning electron microscopy (cryo-SEM), which combines the high-performance imaging of scanning electron microscopy (SEM) with cryogenic ...
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Tom Friedlander
Sunday, November 01, 2009
A standard laboratory microscope is a necessary tool in almost every laboratory in the world. While electron, fluorescence, confocal, and atomic force microscopes (AFMs) are gaining in popularity, the...
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Mark Clymer
Sunday, November 01, 2009
Fluorescence has proven to be a useful technique for identifying, tracking, and studying molecules of interest in biological specimens. In fact, fluorescence is among the fastest growing microscopy ...
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Fabrice Monteau, Jean-Philippe Antignac, Gaud Pinel, Paul Silcock, Peter Hancock, Bruno Le Bizec
Sunday, November 01, 2009
The safety of our food supply can no
longer be taken for granted. As the
world changes and populations continue
to grow, so will the responsibility of
organizations to meet the demand for safe ...
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Larry Scipioni, Paul Alkemade, Vadim Sidorkin, Ping Chen, Diederik Maas, Emile van Veldhoven
Sunday, November 01, 2009
Helium ion microscopy (HIM) offers the highest spatial resolution surface imaging of any scanning beam method, as well as extremely high surface sensitivity.
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