Nov/Dec 2010
Volume 42, Number 11
This issue of American Laboratory features an article on the use of a field emission scanning electron microscope for characterizing nanometer-scale materials. Also in this issue: use of nanospectroscopy for polymer characterization, and confocal microscopes for surface texture analysis.
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Table of Contents
Craig S. Schwandt
Monday, November 01, 2010
Understanding the properties of new materials prior to fabrication can be challenging. Often, the structure of a material at very small scales is critical to its properties and performance.
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Kevin Kjoller, Craig Prater, Roshan Shetty
Monday, November 01, 2010
Despite its widespread applications, infrared microspectroscopy has fundamental spatial resolution limits set by both the laws of optics and practical design constraints.
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Jim Westra, Qing Ping Han, Paul McCoy, Rosanne Isom, Mark Hayward
Monday, November 01, 2010
Laboratory scientists have a finite number of work hours to accomplish their required research. The annual cost of a scientist and laboratory space for this research in today’s modern, instrument ...
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Barbara Foster
Monday, November 01, 2010
Most microscopists are familiar with confocal microscopy from neuroscience or cell biology. However, very quietly and abruptly, confocal has jumped the fence into industry, becoming a major tool-of-...
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Tim Michel
Monday, November 01, 2010
Closed-vessel microwave digestion is
widely recognized as the most effective
technique for the digestion of samples for metals analysis by graphite furnace atomic absorption (GFAA), inductively ...
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